Explore the calibrated surface
Import Nanosurf NID channels, inspect header calibration, compare raw and processed views, and explore the topography in 2D and interactive 3D.
← SOFTWARE COLLECTION / SURFACES & NANOSCALE
RESEARCH SOFTWAREv0.4.0
Afruz AFM Studio
Every surface.
A new perspective.
Calibrated AFM topography, surface roughness, particle metrology, physical PSD and reproducible exports in a coherent scientific workspace.
Developed by AliAfruz
“Cite this softwareVERSION DOI · 10.5281/zenodo.23348914↓SURFACES & NANOSCALELIVE STUDY
Scanning probe + surface landscapeILLUSTRATIVE MODEL
Built around the question.
An AFM image is a landscape of observations. Afruz AFM Studio makes its calibration, preparation and measurements inspectable, from raw channel comparison to particle masks and spectral structure. The Chemitro web lab runs the archived scientific core on your own device, while the desktop edition adds batch analysis and publication exports.
Prepare with a clear history
Huber robust plane leveling, line correction and finite-aware filters preserve your observations. Undo operations and inspect processing differences.
Measure spatial structure
Surface roughness, physically normalized 2D PSD and linear overlap-normalized ACF describe different aspects of the same surface.
Put particles in context
Measure apparent lateral geometry, P95 height and volume with robust backgrounds, calibrated watershed spacing and explicit sampling flags.
Work on your own device
The browser edition imports scans and numerical height matrices without uploading them. Select profiles and crops, inspect masks and download local results.
Keep the analysis traceable
Versioned source fingerprints, CSV and JSON reports connect results to the input and processing history. Desktop Excel, batch recipes and 600 DPI figures extend the workflow.
02 / THE WORKFLOWFROM OBSERVATION TO INTERPRETATION
A little structure.
More room to explore.
- 01Import & inspect→
- 02Prepare the surface→
- 03Measure & compare→
- 04Export & cite→
The archived desktop release passed 34 automated tests. Calibration badges compare header fields rather than certifying instrument accuracy. Lateral sizes remain apparent AFM sizes; sampling flags do not correct tip convolution or establish formal uncertainty. Synthetic examples are illustrative.
Read the documentation ↗“
RESEARCH BUILDS ON CREDIT
Used it? Cite it.
If Afruz AFM Studio contributes to your research, please cite the exact software version you used. This DOI identifies the archived v0.4.0 release.
AliAfruz. (2026). Afruz AFM Studio: Orbit Workspace (v0.4.0) [Software]. Zenodo. https://doi.org/10.5281/zenodo.23348914
All versions: 10.5281/zenodo.23348913 ↗. Use the release DOI above when citing this version.